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维尔克斯光电提供磁光测量仪器 磁光克尔效应测量仪 NEOARK代理
- 主要规格：
- 磁域观测显微镜（Kerr显微镜，磁光克尔效应显微镜）
- 维尔克斯光电提供磁光测量仪器 磁光克尔效应测量仪 NEOARK代理。维尔克斯光电专业代理NEOARK磁光测量系统，磁光克尔效应测量仪，Magneto-Optical Product。磁光测量主要包括磁光克尔效应测量（μ-Kerr Effect）、磁滞回线测量和法拉第效应测量。
日本NEOARK公司成立于1976年，是一家专业从事精密仪器仪表、激光器的高科技公司，在磁光测试领域拥有雄厚的技术实力。Neoark公司 产品产品范围包括：激光光源，激光测量（激光扫描仪、激光光谱分析仪、功率计、激光探测器），激光打标，位移测量仪，振动仪，激光微处理器，激光直接光刻系统，磁光/偏振特性测量等。其中以碘稳频激光器和磁光测量仪器最为出名。维尔克斯光电专业代理NEOARK磁光测量仪器在中国市场的销售。
磁光效应测量系统 Magneto-Optical Effect Measurement System
维尔克斯光电提供磁光测量仪器 磁光克尔效应测量仪 NEOARK代理
关键词：磁光克尔效应
磁滞回线测量：
极性克尔效应（垂直磁化）
纵向克尔效应（平面磁化）
克尔效应测量显微镜
低温
法拉第效应测量
垂直磁各向异性分析（磁场应用的角度依赖性）
在平面磁各向异性分析（磁场应用的角度依赖性）
在平面的倾斜角度评价
磁域观测显微镜（Kerr显微镜，磁光克尔效应显微镜）
应用：显微镜磁域观察
极克尔效应（垂直磁化）
纵向克尔效应（平面磁化）
低温
磁光效应测量系统
关键词：磁滞回线测量
晶圆
磁记忆
硬盘磁头
磁传感器
硬盘
垂直磁记录介质
软衬层（SUL）
头装置
热辅助磁记录（HAMR）硬盘媒体
μ-Kerr Effect Measurement And Magnetic Domain Observation System
BH-PI7892 Series
μ-Kerr Effect Measurement System
BH-PI920 Series
Features
Microscopic Local Magnetic Property Analysis based on
both Polar and Longitudinal Kerr Effect(Not simultaneous measurement)
Suitable for sensitive analysis of μm size magnetic pattern and magnetic thin film
Specification
Measurement Subject: Magneto-Optical Kerr Effect
(Polar and Longitudinal Kerr Effect)
Main Function: Kerr Loop Measurement
Light Source: Diode Laser
Probe Light Spot: φ2-5μm
Generating Magnetic Field: Max. ±10kOe (1T)
*Option: In-Plane Electromagnet
μ-Kerr Effect Measurement and Magnetic Domain Observation System
BH-PI7892 Series
μ-Kerr Effect Measurement and Magnetic Domain Observation System
BH-PI7892 Series
Longitudinal Kerr Effect Measurement System
BH-618 Series
Faraday Effect Measurement System
BH-620 Series
Perpendicular Magnetic Anisotropy Analysis
Features
Magneto-Optical Kerr Effect with motorized rotating Electromagnet
for Magnetic Field Applied Angle Dependence Analysis
In-Plane Magnetic Anisotropy & Skew Angle Analysis
*Magnetic Field Application Angle Dependence Analysis
(Magnetic Field Application Direction: In-Plane Direction)
“For Wafer” Perpendicular Magnetic Layer Evaluation System
Model: BH-810CPC25WF12
Features
Specially Designed for evaluation of Perpendicular Magnetic Layer of 12 Inch Wafer
Specification
Main Function: Kerr Loop Measurement and Mapping Measurement
(Polar Kerr Effect)
Light Source: Diode Laser
Probe Light Spot Size: φ1mm (Typ.)
Generating Magnetic Field: Max. ± 25Oe (2.5T)
“For Wafer” In-Plane Magnetic Layer Evaluation System
Model: BH-618SK-12
“For Hard Disc” Perpendicular Magnetic Recording Layer Evaluation System
Model: BH-810CPC
“For Hard Disc” Soft Under Layer (SUL) Evaluation System
Model: BH-618HS
Features: Specially Designed for evaluation of Soft Under Layer (SUL) of both 2.5 inch
and 3.5 Inch Hard Disk
Magnetic Domain Observation Microscope
BH-786 Series
Features
Magnetic Domain Observation Microscope (Kerr Microscope) with various optional
magnification and magnetic field
Specification
Observation Subject: Magneto-Optical Kerr Effect
(Polar and Longitudinal Kerr Effect)
Main Function: CCD Camera Observation and Image Capturing
Light Source: Mercury Lamp
Observation Resolution: 1μm (Typ.) with x50 Objective Lens
Observation Area: 100 x 70μm with x50 Objective Lens
Generating Magnetic Field: > ± 10kOe (1T)
*Option: In-Plane Electromagnet and Others
Low Temperature Magnetic Domain Observation Microscope
BH-7850 Series
