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  • Materials Science & Engineering Science

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  • 对应法规:Materials Science & Engineering Science
    CNAS认可项目:是


  • Materials Science: Surface analysis and analysis of inorganic and organic materials


    Engineering Science: Outsourced testing and failure analysis services to semiconductor companies

     

    LOD,SAMPLING SIZE AND ANALYTICAL INFORMARION
     


     

    Comparing Analytical Techniques

     





    EQUIPMENT:

    AES

    Auger Electron Spectroscopy

     

    Raman

    Raman Spectroscopy

     

    EBIC

    Electron Beam Induced Current

     

    RBS

    Rutherford Backscattering Spectroscopy

     

    EBSD

    Electron Backscattered Diffraction

     

    SEM

    Scanning Electron Microscopy

     

    EDS

    Energy Dispersive X-Ray   Spectroscopy

     

    SIMS

    Secondary Ion Mass Spectrometry

     

    FIB

    Focused Ion Beam (Single and dual

    Beam Imaging)

     

    SPM

    Scanning Probe Microscopy

     

    FTIR

    Fourier Transform Infrared Spectroscopy

     

    AFM

    Atomic Force Microscopy

     

    GC-MS

    Gas Chromatography Mass

    Spectrometry

     

    TEM

    Transmission Electron Microscopy

     

    GDMS

    Glow Discharge Mass

    Spectrometry

     

    STEM

    Scanning Transmission Electron Microscopy

     

    HFS

    Hydrogen Forward Spectrometry

     

    TGA-IR/MS

    Thermogravimetric Analysis – Infrared

    Spectroscopy/Mass Spectroscopy

     

    ICP-OES

    Inductively Coupled Plasma Optical

    Emission Spectroscopy

     

    DTA

    Differential Thermal Analysis

     

    ICP-MS

    Inductively Coupled Plasma Mass

    Spectrometry

     

    DSC

    Differential Scanning Calorimetry

     

    IGA

    Instrumental Gas Analysis

     

    TOF-SIMS

    Time of Flight Secondary Ion Mass

    Spectrometry

     

    LA-ICP-MS

    Laser Ablation Inductively Coupled

    Plasma Mass Spectrometry

     

    TXRF

    Total Reflection X-Ray Fluorescence

    Spectroscopy

     

    LEXES

    Low Energy X-Ray Emission

    Spectroscopy

     

    XPS/ESCA

    Spectroscopy for  Chemical Analysis

     

    NRA

    Nuclear Reaction Analysis

     

    XRD

    X-Ray Diffraction

     

    OP

    Optical Profilometry

     

    XRF

    X-Ray Fluorescence

     

    PIXE

    Particle Induced X-Ray Emission

     

    XRR

    X-Ray Reflectivity

     



     

        


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